Nanoscale Characterisation of Ferroelectric Materials : Scaning Probe Microscopy Approach
Nanoscale Characterisation of Ferroelectric Materials : Scaning Probe Microscopy Approach
- Berlin : Springer-Verlag, 2004
- 282 p. : ill
3540206620
Nanostructured materials
Nanotechnology
TA418.9.N35 / N175 2004
3540206620
Nanostructured materials
Nanotechnology
TA418.9.N35 / N175 2004

AI Search