Fakebusters II :  scientific detection of fakery in art and philately / 
 Scientific detection of fakery in art and philately 
edited by Richard J. Weiss and Duane Chartier. 
 - Hackensack, N.J. :  World Scientific,  2004. 
 - 317 p.  ill.  
<br/><br/> "Based on the proceedings of the symposium held at Photonics East 1999 in Boston on September 20-21, 1999, sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA ; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA ; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland." 
<br/><br/>HKBU library 
<br/><br/> YT2025 M08 
<br/><br/><label>ISBN: </label>9812560254 9789812560254 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Art--Forgeries<br/>Art--Radiography<br/>Art--Expertising<br/>Expertising, X-ray<br/>Science and the arts<br/>Art and science<br/>Vervalsing.<br/>Detectie.<br/>Wetenschappelijke technieken.
<br/><br/><label>LC Class. No.: </label>N8790  / F176 2004