01655cam a22003737a 4500 070503s2004 njuaf b 000 0 eng d 9812560254 9789812560254 SDU N8790 F176 2004 Fakebusters II : scientific detection of fakery in art and philately / edited by Richard J. Weiss and Duane Chartier. Scientific detection of fakery in art and philately Hackensack, N.J. : World Scientific, 2004. 317 p. ill. "Based on the proceedings of the symposium held at Photonics East 1999 in Boston on September 20-21, 1999, sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA ; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA ; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland." HKBU library YT2025 M08 Art Forgeries Art Radiography 179625 Art Expertising 179626 Expertising, X-ray 179627 Science and the arts Art and science Vervalsing. 179630 Detectie. 179631 Wetenschappelijke technieken. 156960 Weiss, Richard J. 1923- 222799 Chartier, Duane R. 179633 Society of Photo-optical Instrumentation Engineers. 179634 International Center for Art Intelligence. 179635 Fakes, Forgeries, and Experts (Organization) 179636 = C.1 SDU GBE lcc 100155 100155 0 0 lcc 0 N8790 F176 02004 0 CGB 279838 SDU SDU GEN3 2025-08-29 2 0 N8790 F176 2004 1000368680 2025-08-29 00:00:00 C.1 SDU 2025-08-29 GBE