scientific detection of fakery in art and philately Weiss, Richard J. 1923- Chartier, Duane R. Society of Photo-optical Instrumentation Engineers International Center for Art Intelligence Fakes, Forgeries, and Experts (Organization) text bibliography nju Hackensack, N.J World Scientific 2004 monographic eng

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317 p. ill. HKBU library edited by Richard J. Weiss and Duane Chartier. "Based on the proceedings of the symposium held at Photonics East 1999 in Boston on September 20-21, 1999, sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA ; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA ; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland." YT2025 M08 Art Forgeries Art Radiography Art Expertising Expertising, X-ray Science and the arts Art and science Vervalsing Detectie Wetenschappelijke technieken N8790 F176 2004 9812560254 9789812560254 SDU 070503