TY  - BOOK
AU  - Weiss,Richard J.
AU  - Chartier,Duane R.
ED  - Society of Photo-optical Instrumentation Engineers.
ED  - International Center for Art Intelligence.
ED  - Fakes, Forgeries, and Experts (Organization)
TI  - Fakebusters II: scientific detection of fakery in art and philately 
SN  - 9812560254
AV  - N8790 F176 2004
PY  - 2004///
CY  - Hackensack, N.J.
PB  - World Scientific
KW  - Art
KW  - Forgeries
KW  - Radiography
KW  - Expertising
KW  - Expertising, X-ray
KW  - Science and the arts
KW  - Art and science
KW  - Vervalsing
KW  - Detectie
KW  - Wetenschappelijke technieken
N1  - "Based on the proceedings of the symposium held at Photonics East 1999 in Boston on September 20-21, 1999, sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA ; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA ; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland."; HKBU library; YT2025 M08
ER  -