01829cam a22003857a 4500008004100000020001500041020001800056040000800074050002100082245012400103246005600227260004900283300001800332500036800350505001700718518001500735650001900750650002900769650002900798650003100827650002500858650002000883650002400903650002200927650004200949700003700991700003101028710006401059710005501123710005701178900001401235942001301249999001901262952016201281070503s2004    njuaf    b    000 0 eng d  a9812560254  a9789812560254  aSDU00aN8790bF176 200400aFakebusters II :bscientific detection of fakery in art and philately /cedited by Richard J. Weiss and Duane Chartier.3 aScientific detection of fakery in art and philately  aHackensack, N.J. :bWorld Scientific,c2004.  a317 p.bill.   a"Based on the proceedings of the symposium held at Photonics East 1999 in Boston on September 20-21, 1999, sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA ; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA ; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland."  aHKBU library  aYT2025 M08 0aArtxForgeries 0aArtxRadiography9179625 0aArtxExpertising9179626 0aExpertising, X-ray9179627 0aScience and the arts 0aArt and science17aVervalsing.917963017aDetectie.917963117aWetenschappelijke technieken.91569601 aWeiss, Richard J.d1923-92227991 aChartier, Duane R.91796332 aSociety of Photo-optical Instrumentation Engineers.91796342 aInternational Center for Art Intelligence.91796352 aFakes, Forgeries, and Experts (Organization)9179636  a= C.1 SDU  cGBE2lcc  c100155d100155  00102lcc406N8790 F176  02004708CGB9279838aSDUbSDUcGEN3d2025-08-29e2l0oN8790 F176 2004p1000368680r2025-08-29 00:00:00tC.1 SDUw2025-08-29yGBE