Beaton, Neil J. <br/><br/>
Stochastic reliability modeling, optimization and applications /  
editors, Syouji Nakamura, Toshio Nakagawa. 
 - Hackensack, NJ :   World Scientific,   2010. 
 - 300 p. :  ill. ; 
<br/><br/>HKBU library 
<br/><br/><label>ISBN: </label>9789814277433 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Reliability (Engineering) --Mathematical models.<br/>Stochastic systems.
<br/><br/><label>LC Class. No.: </label>TA169  / S864 2010