Operational risk management :   a practical approach to intelligent data analysis /  
edited by Ron S. Kenett, Yossi Raanan. 
 - Hoboken, N.J. :   John Wiley & Sons,   2011. 
 - 285 p. :  ill. 
<br/><br/>HKBU library 
<br/><br/> YT2025 M08 
<br/><br/><label>ISBN: </label>9780470747483 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Risk management.<br/>Quality control.<br/> Information technology --Quality control.<br/>Process control.
<br/><br/><label>LC Class. No.: </label>HD61  / O61 2011