Nanoscale Characterisation of Ferroelectric Materials : Scaning Probe Microscopy Approach 

 - Berlin :  Springer-Verlag,  2004 
 - 282 p. :  ill 
<br/><br/><label>ISBN: </label>3540206620 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Nanostructured materials<br/>Nanotechnology
<br/><br/><label>LC Class. No.: </label>TA418.9.N35  / N175 2004