00870nam a2200265 a 4500 vtls000056704 MTX 041104 2004 eng 000 0 eng d 3540206620 (TH)vtls000038775 (VRT)vtls000056704 201506251732 cat4 201311071622 VLOAD 201311071551 VLOAD 201103151112 staff 200411041348 cat4 TA418.9.N35 N175 2004 SC000 SC007 Nanoscale Characterisation of Ferroelectric Materials : Scaning Probe Microscopy Approach Berlin : Springer-Verlag, 2004 282 p. : ill Nanostructured materials 55841 Nanotechnology 55688 Alexe, M (Marin), ed. 55842 Gruverman A (Alexei), ed. 55843 GBE 36571 36571 2018-03-12 00:00:00 0 TA418.9.N35 N175 2004 1000163190 1 2018-03-12 GBE 0 0 0 CGB 0 SDU SDU GEN3 2018-03-12 0.00