Nanoscale Characterisation of Ferroelectric Materials : Scaning Probe Microscopy Approach
Alexe, M (Marin)
ed
Gruverman A (Alexei)
ed
text
eng
Berlin
Springer-Verlag
2004
monographic
eng
282 p. : ill
Nanostructured materials
Nanotechnology
TA418.9.N35 N175 2004
3540206620
041104
vtls000056704