Stochastic reliability modeling, optimization and applications / editors, Syouji Nakamura, Toshio Nakagawa.

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TextPublication details: Hackensack, NJ : World Scientific, 2010.Description: 300 p. : illISBN:

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Holdings
Cover image	Item type	Current library	Home library	Collection	Shelving location	Call number	Materials specified	Vol info	URL	Copy number	Status	Notes	Date due	Barcode	Item holds	Item hold queue priority	Course reserves
	English Books	MATRIX Library General Eng/FL.3		General Books		TA169 S864 2010 (Browse shelf(Opens below))				C.1	Available			1000365204

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