000 01655cam a22003737a 4500
008 070503s2004 njuaf b 000 0 eng d
020 _a9812560254
020 _a9789812560254
040 _aSDU
050 0 0 _aN8790
_bF176 2004
245 0 0 _aFakebusters II :
_bscientific detection of fakery in art and philately /
_cedited by Richard J. Weiss and Duane Chartier.
246 3 _aScientific detection of fakery in art and philately
260 _aHackensack, N.J. :
_bWorld Scientific,
_c2004.
300 _a317 p.
_bill.
500 _a"Based on the proceedings of the symposium held at Photonics East 1999 in Boston on September 20-21, 1999, sponsored by SPIE, the International Optical Engineering Society, Bellingham, WA 98227-0010, USA ; ICAI, the International Center for Art Intelligence, Culver City, CA 90230-5109, USA ; FFE, Fakes, Forgeries, and Experts, Castagnola, CH-6976, Switzerland."
505 _aHKBU library
518 _aYT2025 M08
650 0 _aArt
_xForgeries
650 0 _aArt
_xRadiography
_9179625
650 0 _aArt
_xExpertising
_9179626
650 0 _aExpertising, X-ray
_9179627
650 0 _aScience and the arts
650 0 _aArt and science
650 1 7 _aVervalsing.
_9179630
650 1 7 _aDetectie.
_9179631
650 1 7 _aWetenschappelijke technieken.
_9156960
700 1 _aWeiss, Richard J.
_d1923-
_9222799
700 1 _aChartier, Duane R.
_9179633
710 2 _aSociety of Photo-optical Instrumentation Engineers.
_9179634
710 2 _aInternational Center for Art Intelligence.
_9179635
710 2 _aFakes, Forgeries, and Experts (Organization)
_9179636
900 _a= C.1 SDU
942 _cGBE
_2lcc
999 _c100155
_d100155