| 000 | 00734nam a2200217 a 4500 | ||
|---|---|---|---|
| 008 | 161107s2010 si a s 001 0 eng | ||
| 020 | _a9789814277433 | ||
| 040 | _aSDU | ||
| 050 | 0 | 0 |
_aTA169 _bS864 2010 |
| 100 | 1 |
_aBeaton, Neil J. _9222590 |
|
| 245 | 1 | 4 |
_aStochastic reliability modeling, optimization and applications / _ceditors, Syouji Nakamura, Toshio Nakagawa. |
| 260 |
_aHackensack, NJ : _bWorld Scientific, _c2010. |
||
| 300 |
_a300 p. : _bill. ; |
||
| 505 | _aHKBU library | ||
| 650 | 0 |
_aReliability (Engineering) _xMathematical models. _9222594 |
|
| 650 | 0 |
_aStochastic systems. _9222595 |
|
| 700 | 1 |
_aNakamura, Syouji. _9222596 |
|
| 700 | 1 |
_aNakagawa, Toshio _9222597 |
|
| 900 | _a = C.1 SDU | ||
| 942 |
_cEBK _2lcc |
||
| 999 |
_c113655 _d113655 |
||