Nanoscale Characterisation of Ferroelectric Materials : Scaning Probe Microscopy Approach

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TextPublication details: Berlin : Springer-Verlag, 2004Description: 282 p. : illISBN:

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English Books

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Cover image	Item type	Current library	Home library	Collection	Shelving location	Call number	Materials specified	Vol info	URL	Copy number	Status	Notes	Date due	Barcode	Item holds	Item hold queue priority	Course reserves
	English Books	MATRIX Library General Eng/FL.3		General Books		TA418.9.N35 N175 2004 (Browse shelf(Opens below))				1	Available			1000163190

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